Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations Volume 2 - Paperback
Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations Volume 2 - Paperback
About this item
by David H. Krantz (Author), R. Duncan Luce (Author), Amos Tversky (Author)
All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.
Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance.
Author Biography
David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.
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