Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Paperback
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Paperback
FormatBook
Language
English
ISBN-13 / SKU
9781606505885
About this item
by Fred Stevie (Author)
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Author Biography
Senior Researcher, North Carolina State University
Number of Pages: 277
Dimensions: 0.61 x 9 x 6 IN
Publication Date: September 15, 2015
$93.26
In Stock.
Nationwide Shipping
We deliver across the USA.
Sold by
Novelly Books
Curated additions for your library
TM 9-2320-289-34 CUCV Commercial Utility Cargo Vehicle Direct Support / General Support Manual May 1992 w/Change 1&2 - Paperback
$69.96
Practical Forging and Art Smithing - Hardcover
$46.63
Data Analytics Made Easy: Analyze and present data to make informed decisions without writing any code - Paperback
$54.41
Corvette: 1963-1967 - Paperback
$37.98
Your Florida Guide to Butterfly Gardening, Second Edition: A Guide for the Deep South - Paperback
$26.95